TLNC Nano Profiler
Single-shot, non-contact surface profiling for optical components.
The TLNC Nano Profiler rapidly characterizes flat optical components such as mirrors. It captures the surface profile in a single shot, without scanning, with a specified accuracy better than 200 nm.
Quick setup and calibration make the system suitable for both laboratory and production metrology. The optical and mechanical configuration can be adapted for non-flat components and other application-specific requirements.
Features
- Fast, non-contact surface-profile measurement
- Single-shot operation with no scanning
- Components up to 80 mm in diameter or 55 × 55 mm square, with application-specific optimization available
- 633 nm operating wavelength, with other wavelengths available on request
- Specified accuracy better than 200 nm
- Dynamic range (max. P-V) up to 100 µm
Technical documentation
| Datasheet | Download |